1997

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  1. G.M.P. van Kempen, L.J. van Vliet, P.J. Verveer, and H.T.M. van der Voort, A quantitative comparison of image restoration methods for confocal microscopy, Journal of Microscopy - Oxford, vol. 185, no. 3, 1997, 354-365.

  2. F.R. Boddeke, L.J. van Vliet, and I.T. Young, Calibration of the automated z-axis of a microscope using focus functions, Journal of Microscopy - Oxford, vol. 186, no. 3, 1997, 270-274.

  3. H. Netten, I.T. Young, L.J. van Vliet, H.J. Tanke, H. Vrolijk, and W.C.R. Sloos, FISH and chips: Automation of fluorescent dot counting in interphase cell nuclei, Cytometry, vol. 28, no. 1, 1997, 1-10.

  4. E.B. van Munster, L.J. van Vliet , and J.A. Aten, Reconstruction of optical pathlength distributions from images obtained by a wide-field differential interference contrast microscope., Journal of Microscopy - Oxford, vol. 188, no. 2, 1997, November, 149-157.

  5. G.M.P. van Kempen, L.J. van Vliet, and P.J. Verveer, Application of image restoration methods for confocal fluorescence microscopy, in: C.J. Cogswell, J.-A. Conchello, T. Wilson (eds.), 3-D Microscopy: Image Acquisition and Processing IV, Proc. SPIE, vol. 2984, 1997, 114-124.

  6. E.B. van Munster, L.J. van Vliet, and J.A. Aten, Quantitative interferometric imaging using a conventional differential interference contrast microscope, in: A.V. Priezzhev, T. Asakura, R.C. Leif (eds.), Optical Diagnostics of Biological Fluids and Advanced Techniques in Analytical Cytology, Proc. SPIE, vol. 2982, 1997, 458-467.

  7. M. van Ginkel, P.W. Verbeek, and L.J. van Vliet, Multi-orientation estimation: Selectivity and localization, in: H.E. Bal, H. Corporaal, P.P. Jonker, J.F.M. Tonino (eds.), ASCI'97, Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 2-4), ASCI, Delft, 1997, 99-105.

  8. G.M.P. van Kempen and L.J. van Vliet, Improving the restoration of textured objects with prefiltering, in: H.E. Bal, H. Corporaal, P.P. Jonker, J.F.M. Tonino (eds.), ASCI'97, Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 2-4), ASCI, Delft, 1997, 174-179.

  9. M. van Ginkel, P.W. Verbeek, and L.J. van Vliet, Improved Orientation Selectivity for Orientation Estimation, in: M. Frydrych, J. Parkkinen, A. Visa (eds.), SCIA'97, Proc. 10th Scandinavian Conference on Image Analysis (Lappeenranta, Finland, June 9-11), 1997, 533-537.

  10. D. Sudar, L.J. van Vliet, S. Clark, R. Segraves, S. Lockett, D. Albertson, J. Gray, D. Pinkel, Design of a Widefield High Sensitivity Imaging System for Quantitative Analysis of CGHa Micro-Arrays. Microscopy and Microanalysis. 3:811-812, 1997.