1999

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  1. E.R. Meinders, G.M.P. van Kempen, L.J. van Vliet, and T.H. van der Meer, Measurement and application of an infrared image restoration filter to improve the accuracy of surface temperature measurements of cubes, Experiments in Fluids, vol. 26, 1999, 86-96.

  2. G.M.P. van Kempen, and L.J. van Vliet, The influence of the background estimation on the superresolution properties of non-linear image restoration algorithms, in: D. Cabib, C.J. Cogswell, J.-A. Conchello, J.M. Lerner, T. Wilson (eds.), Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI, Proc. SPIE, Progress in Biomedical Optics, vol. 3605, 1999, 179-189.

  3. L.R. van den Doel, M.J. Vellekoop, P.M. Sarro, S. Picoreanu, R. Moerman, J. Frank, G. van Dedem, K.T. Hjelt, L.J. van Vliet, and I.T. Young, Fluorescence detection in (sub-)nanoliter microarrays, in: M. Ferrari (eds.), Micro- and Nanofabricated Structures and Devices for Biomedical Environmental Applications II, Proc. SPIE, Progress in Biomedical Optics, vol. 3606, 1999, 28-39.

  4. J. Dijk, D. de Ridder, P.W. Verbeek, J. Walraven, I.T. Young, and L.J. van Vliet, A new measure for the effect of sharpening and smoothing filters on images, in: B.K. Ersboll, P. Johansen (eds.), SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis (Kangerlussuaq, Greenland, June 7-11), Pattern Recognition Society of Denmark, Lyngby, 1999, 213-220.

  5. D. de Ridder, R.P.W. Duin, P.W. Verbeek, and L.J. van Vliet, A weight set decorrelating algorithm for neural network interpretation and symmetry breaking, in: B.K. Ersboll, P. Johansen (eds.), SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis (Kangerlussuaq, Greenland, June 7-11), Pattern Recognition Society of Denmark, Lyngby, 1999, 739-746.

  6. M. van Ginkel, J. van de Weijer, L.J. van Vliet, and P.W. Verbeek, Curvature estimation from orientation fields, in: B.K. Ersboll, P. Johansen (eds.), SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis (Kangerlussuaq, Greenland, June 7-11), Pattern Recognition Society of Denmark, Lyngby, 1999, 545-551.

  7. G.M.P. van Kempen, N. van den Brink, L.J. van Vliet, M. van Ginkel, P.W. Verbeek, and H. Blonk, The application of a local dimensionality estimator to the analysis of 3D microscopic network structures, in: B.K. Ersboll, P. Johansen (eds.), SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis (Kangerlussuaq, Greenland, June 7-11), Pattern Recognition Society of Denmark, Lyngby, 1999, 447-455.

  8. L.J. van Vliet and C.L.L. Hendriks, Improving spatial resolution in exchange of temporal resolution in aliased image sequences, in: B.K. Ersboll, P. Johansen (eds.), SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis (Kangerlussuaq, Greenland, June 7-11), Pattern Recognition Society of Denmark, Lyngby, 1999, 493-499.

  9. P. Bakker, L.J. van Vliet, and P.W. Verbeek, Edge preserving orientation adaptive filtering, in: M. Boasson, J.A. Kaandorp, J.F.M. Tonino, M.G. Vosselman (eds.), ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 15-17), ASCI, Delft, 1999, 207-213.

  10. J. Dijk, D. de Ridder, P.W. Verbeek, J. Walraven, I.T. Young, and L.J. van Vliet, A quantitative measure for the perception of sharpening and smoothing in images, in: M. Boasson, J.A. Kaandorp, J.F.M. Tonino, M.G. Vosselman (eds.), ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 15-17), ASCI, Delft, 1999, 291-298.

  11. C.L. Luengo Hendriks and L.J. van Vliet, Resolution enhancement of a sequence of undersampled shifted images, in: M. Boasson, J.A. Kaandorp, J.F.M. Tonino, M.G. Vosselman (eds.), ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 15-17), ASCI, Delft, 1999, 95-102.

  12. M. van Ginkel, J. van de Weijer, P.W. Verbeek, and L.J. van Vliet, Curvature estimation from orientation fields, in: M. Boasson, J.A. Kaandorp, J.F.M. Tonino, M.G. Vosselman (eds.), ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 15-17), ASCI, Delft, 1999, 299-306.

  13. L.R. van den Doel, I.T. Young, and L.J. van Vliet, Monitoring the evaporation process of liquid samples in sub-nanoliter vials, in: M. Boasson, J.A. Kaandorp, J.F.M. Tonino, M.G. Vosselman (eds.), ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging (Heijen, NL, June 15-17), ASCI, Delft, 1999, 58-64.

  14. P. Bakker, L.J. van Vliet, and P.W. Verbeek, Edge preserving orientation adaptive filtering, Proc. IEEE-CS Conf. Computer Vision and Pattern Recognition (Fort Collins, CO, June 23-25), IEEE Computer Society Press, Los Alamitos, CA, 1999, 535-540.

  15. D. de Ridder, R.P.W. Duin, P.W. Verbeek, L.J. van Vliet, The use of neural networks in non-linear image processing, Pattern Analysis and Applications, vol. 2, no. 2, 1999, 111-128.