2001

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  1. J. Van de Weijer, L.J. van Vliet, P.W. Verbeek, M. van Ginkel, Curvature estimation in oriented patterns using curvilinear models applied to gradient vector fields, IEEE Pattern Analysis and Machine Intelligence, Vol. 23, No. 9, 2001, 1035-1042.

  2. L.R. van den Doel, L.J. van Vliet, Temporal phase unwrapping algorithm for dynamic interference pattern analysis in interference-contrast microscopy, Applied Optics: Optical Technology and Biomedical Optics, Vol. 40, No. 25, 2001, 4487-4500.

  3. I.T. Young, K.T Hjelt, R van den Doel, M.J. Vellekoop, L.J. van Vliet, Measuring liquid volumes in sub-nanoliter wells, In: R.P. Mariella, and D.V. Nicolau (eds.), Biomedical Instrumentation Based on Micro- and Nanotechnology II (Proc. Conf. San Jose, CA, Jan.24-25), Proc. SPIE, Progress in Biomedical Optics, vol. 4265, 2001, 75-80.

  4. C.L. Luengo Hendriks and L.J. van Vliet, Segmentation-Free Estimation of Length Distributions Using Sieves and RIA Morphology, in: M. Kerckhove (eds.), Third International Conference, Scale-Space 2001 (Vancouver, Canada, July 7-8), Lecture Notes in Computer Science, vol. 2106, Springer Verlag, Berlin, 2001, 389-406.

  5. C.L. Luengo Hendriks and L.J. van Vliet, A Rotation-Invariant Morphology for Shape Analysis of Anisotropic Objects and Structures, in: C. Arcelli, L.P. Cordella, G. Sanniti di Baja (eds.), IWVF4, 4th International Workshop on Visual Form (Capri, Italy, May 28-30), Lecture Notes in Computer Science, vol. 2059, Springer Verlag, Berlin, 2001, 378-387.

  6. P. Bakker, P.W. Verbeek and L.J. van Vliet, Confidence and curvature estimation of curvilinear structures in 3-D, ICCV'01 (Vancouver, Canada, July 9-12) volume II, IEEE Computer Society Press, Los Alamitos, CA, 2001, 139-144.

  7. L.R. van den Doel, L.J. van Vliet, and I.T. Young, Design Considerations for a Conventional Microscope based Microarray-Reader to Improve Sensitivity, in: J. Graham (eds.), QME 2, Proc. 2nd Euroconference on Quantitative Molecular Cytogenetics (Salamanca, E, Apr.26-28), 2001, 108-113.

  8. B. Rieger and L.J. van Vliet, Estimation of Curvature of n-dimensional Space Curves in Grey-value Images, in: R.L. Lagendijk, J.W.J. Heijnsdijk, A.D. Pimentel, M.H.F. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 436-442.

  9. P. Bakker, P.W. Verbeek, and L.J. van Vliet, Analysis and detection of 3D curvilinear structures, in: R. Lagendijk, A. Pimentel, M. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 35-40.

  10. C.L. Luengo Hendriks and L.J. van Vliet, Segmentation-free estimation of length distributions using sieves and RIA morpholgy, in: R. Lagendijk, A. Pimentel, M. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 129-136.

  11. M. van Ginkel, L.J. van Vliet, P.W. Verbeek, M.A. Kraaijveld, E.P. Reding, and H.J. Lammers, Robust curve detection using a Radon transform in orientation space applied to fracture detection in borehole images, in: R. Lagendijk, A. Pimentel, M. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 84-91.

  12. L.R. van den Doel, I.T. Young, and L.J. van Vliet, Design considerations for a conventional microscope based microarray reader to improve sensitivity, in: R. Lagendijk, A. Pimentel, M. Wilkinson (eds.), Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging (Heijen, NL, May 30-June 1), ASCI, Delft, 2001, 70-77.

  13. M. van Ginkel, L.J. van Vliet, and P.W. Verbeek, Applications of image analysis in orientation space, in: A.M. Vossepoel, F.M. Vos (eds.), Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 2001, 355-370.

  14. G.M.P. van Kempen and L.J. van Vliet, Prefiltering: Reducing the noise sensitivity of non-linear image restoration algorithms, in: A.M. Vossepoel, F.M. Vos (eds.), Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 2001, 411-422.

  15. L.J. van Vliet, I.T. Young, and P.W. Verbeek, Recursive Gaussian derivative filters (reprint of: A.K. Jain, S. Venkatesh, B.C. Lovell (eds.), ICPR'98, Proc. 14th Int. Conference on Pattern Recognition (Brisbane, Aug. 16-20), IEEE Computer Society Press, Los Alamitos, 1998, 509-514), in: A.M. Vossepoel, F.M. Vos (eds.), Fourth Quinquennial Review 1996-2001 Dutch Society for Pattern Recognition and Image Processing, NVPHBV, Delft, 2001, 317-322.