Selected Papers

In press

  1.  

Selected Publications

  1. I.W.O. Serlie, F.M. Vos, R. Truyen, R., F.H. Post, L.J. van Vliet, Classifying CT Image Data Into Material Fractions by a Scale and Rotation Invariant Edge Model, IEEE Transactions on Image Processing, vol. 16, Issue 12, 2007, 2891-2904.
  2. C.L. Luengo Hendriks, G.M.P. van Kempen, L.J. van Vliet, Improving the accuracy of isotropic granulometries, Pattern Recognition Letters, vol. 28, 2007. 865-872.
  3. A. W. M. van Eekeren, K. Schutte, O. R. Oudegeest, and L. J. van Vliet, Performance evaluation of super-resolution reconstruction methods on real-world data, EURASIP Journal on Advances in Signal Processing, vol. 2007, Article ID 43953, 11 pages, 2007. doi:10.1155/2007/43953.
  4. Y.S. Wu, L.J. van Vliet, H.W. Frijlink, K. van der Voort Maarschalk, Pore size distribution in tablets measured with a morphological sieve, International Journal of Pharmaceutics, vol. 342, 2007, 176-183.
  5. G. van Dalen, P. Nootenboom, L.J. van Vliet, L. Voortman, E. Esveld, 3D imaging, analysis and modelling of porous cereal products using X-ray microtomography, Image Analysis & Stereology, vol. 26, 2007, 169-177.
  6. I. Rivera Rabelo, S.M. Luthi, L.J. van Vliet, Parameterization of meander belt systems in high-resolution 3D seismic data with the aid of the geoTime cube and modern analogues, in: R.J. Davies, H.W. Posamentier, L.J. Wood, J.A. Cartwright, (eds), Seismic Geomorpology: Applications to Hydrocarbin Exploration and Production, Geological Society, London, Special Publications, vol. 277, 2007, 121-137.
  7. T.Q. Pham, L.J. van Vliet, and K. Schutte, Robust fusion of irregularly sampled data using adaptive normalized convolution, EURASIP Journal on Applied Signal Processing, article ID 83268, 2006, 1-12.
  8. K.A. Vermeer, F.M. Vos, B. Lo, Q. Zhou, H.G. Lemij, A.M. Vossepoel, and L.J. van Vliet, Modeling of scanning laser polarimetry images of the human retina for progression detection of glaucoma, IEEE Transactions on Medical Imaging, vol. 25, no. 5, 2006, 517-528.
  9. M.W.A. Caan, K.A. Vermeer, L.J. van Vliet, C.B.L.M. Majoie, B.D. Peters, G.J. den Heeten, and F.M. Vos, Shaving diffusion tensor images in discriminant analysis: A study into schizophrenia, Medical Image Analysis, vol. 10, no. 6, 2006, 841-849.
  10. Y.S. Wu, L.J. van Vliet, H.W. Frijlink, K. van der Voort Maarschalk, The determination of relative path length as a measure for tortuosity in compacts using image analysis, European Journal of Pharmaceutical Sciences, vol. 28, 2006, 433-440.
  11. N.J.J.P. Koenderink, J.L. Top, L.J. van Vliet, Supporting Knowledge-Intensive Inspection Tasks with Application Ontologies, International Journal of Human Computer Studies, vol. 64, 2006, 974-983.
  12. C. van Wijk, V.F. van Ravesteijn, F.M. Vos, R. Truyen, L.J. van Vliet, Detection of protrusions in curved folded surfaces applied to automated polyp detection in CT colonography, in: Rasmus Larsen, Mads Nielsen, Jon Sporring (eds.), Medical Image Computing and Computer-Assisted Intervention MICCAI 2006 (Proc. 9th Int. Conf., Copenhagen, Denmark, Oct.1-6) Part II , Lecture Notes in Computer Science, vol. 4191, Springer Verlag, Heidelberg, 2006, 471-478.
  13. C.L. Luengo Hendriks and L.J. van Vliet, Using line segments as structuring elements for sampling-invariant measurements, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 27, no. 11, 2005, 1826-1831.
  14. C.L. Luengo Hendriks, M. van Ginkel, P.W. Verbeek, and L.J. van Vliet, The generalized Radom transform: sampling, accuracy and memory considerations, Pattern Recognition, vol. 38, no. 12, 2005, 2494-2505.
  15. H. Bouma, A. Vilanova, L.J. van Vliet, and F.A. Gerritsen, Correction for the dislocation of curved surfaces caused by the PSF in 2D and 3D CT images, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 27, no. 9, 2005, 1501-1507.
  16. L.R. van den Doel, P.T. Nagy, L.J. van Vliet, and G.P. Neitzel, Regularized phase-tracker with iso-phase scanning strategy for analysis of dynamic interferograms of nonwetting droplets under excitation, Applied Optics (Optical Society of America), vol. 44, no. 14, 2005, 2695-2704.
  17. Y.S. Wu, H.W. Frijlink, L.J. van Vliet, I. Stokroos, and K. van der Voort Maarschalk, Localization dependent analysis of porosity and pore direction in tablets, Pharmaceutical Research, vol. 22, no. 8, 2005, 1399-1405.
  18. T.Q. Pham, M. Bezuijen, L.J. van Vliet, K. Schutte, and C.L. Luengo Hendriks, Performance of optimal registration estimators, in: Z. Rahman, R.A. Schowengerdt, S.E. Reichenbach (eds.), Visual Information Processing XIV (SPIE Defense and Security Symposium, Orlando, Florida, USA, Mar.29-Apr.1), Proc. SPIE, vol. 5817, 2005, 133-144.
  19. T.Q. Pham, L.J. van Vliet, and K. Schutte, Influence of signal-to-noise ratio and point spread function on limits of super-resolution, in: E.R. Dougherty, J.T. Astola, K.O. Egiazarian (eds.), Image Processing: Algorithms and Systems IV (IS&T/SPIE's 17th Annual Symposium Electronic Imaging, San Jose, California, USA, Jan.1620), Proc. SPIE, vol. 5672, 2005, 169-180.
  20. H.R.C. Dietrich, J. Knoll, L.R. van den Doel, G.W.K. van Dedem, P.A.S. Daran-Lapujade, L.J. van Vliet, R. Moerman, J.T. Pronk, and I.T. Young, Nanoarrays: A Method for Performing Enzymatic Assays, Analytical Chemistry, vol. 76, no. 14, 2004, 15 July, 4112-4117.
  21. B. Rieger and L.J. van Vliet, A systematic approach to nD orientation representation, Image and Vision Computing, vol. 22, no. 6, 2004, 453-459.
  22. B. Rieger, H.R.C. Dietrich, L.R. van den Doel, and L.J. van Vliet, Diffusion of microspheres in sealed and open microarrays,, Microscopy Research and Technique, vol. 65, no. 3, 2004, 218-225.
  23. B. Rieger, F.J. Timmermans, L.J. van Vliet, and P.W. Verbeek, On curvature estimation of iso-surfaces in 3D gray-value images and the computation of shape descriptors, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 26, no. 8, 2004, 1088-1094.
  24. B. Rieger, C. Molenaar, R.W. Dirks, and L.J. van Vliet, Alignment of the cell nucleus from labeled proteins only for 4D in vivo imaging, Microscopy Research and Technique, vol. 64, no. 2, 2004, 142-150.
  25. B. Rieger, L.R. van den Doel, and L.J. van Vliet, Ring formation in nanoliter cups: Quantitative measurements of flow in micromachined wells, Physical Review E, vol. 68, no. 3, 2003, 036312/1-9.
  26. I.T. Young, R. Moerman, L.R. van den Doel, V. Iordanov, A. Kroon, H. Dietrich, G.W.K. van Dedem, A. Bossche, B.L. Gray, L. Sarro, P.w. Verbeek, L.J. van Vliet, Monitoring enzymatic reactions in nanoliter wells, Journal of Microscopy - Oxford, vol. 212, no. 3, 2003, 254-263.
  27. M. Krabbendam, J.L. Urai, L.J. van Vliet, Grain size stabilization by dispersed graphite in a high-grade quartz mylonite: an example from Naxos (Greece), Journal of Structural Geology, vol. 25, 2003, 855-866.
  28. J.P.M. van Duynhoven, G.M.P. van Kempen, R. van Sluis, B. Rieger, P. Weegels, L.J. van Vliet, K. Nicolay, Quantitative assessment of gas cell development during the proofing of dough by magnetic resonance imaging and image analysis, Cereal Chemistry, Vol. 80, No. 4, 2003, 390-395.
  29. B. Rieger, L.J. van Vliet, Curvature of n-dimensional space curves in grey-value images, IEEE Transactions on Image Processing, Vol. 11, No. 7, 2002, 738-745.
  30. I.T. Young, L.J. van Vliet, M. van Ginkel, Recursive Gabor filtering, IEEE Transactions on Signal Processing, Vol. 50, No. 11, 2798-2805, 2002.
  31. J. Van de Weijer, L.J. van Vliet, P.W. Verbeek, M. van Ginkel, Curvature estimation in oriented patterns using curvilinear models applied to gradient vector fields, IEEE Pattern Analysis and Machine Intelligence, Vol. 23, No. 9, 2001, 1035-1042.
  32. L.R. van den Doel, L.J. van Vliet, Temporal phase unwrapping algorithm for dynamic interference pattern analysis in interference-contrast microscopy, Applied Optics: Optical Technology and Biomedical Optics, Vol. 40, No. 25, 2001, 4487-4500.
  33. G.M.P. van Kempen, L.J. van Vliet, Background estimation in non-linear image restoration, Journal of the Optical Society of America A - Optics and Image Science, vol. 17, no. 3, 2000, 425-433.
  34. G.M.P. van Kempen, L.J. van Vliet, The influence of the regularisation parameter and the first estimate on the performance of Tikhonov regularised non-linear image restoration algorithms, Journal of Microscopy, vol. 198, no. 1, 2000, 63-76.
  35. G.M.P. van Kempen, and L.J. van Vliet, Mean and variance of ratio estimators used in fluorescence ratio imaging , Cytometry, vol. 39, no. 4, 2000, 300-305.
  36. C.L. Luengo Hendriks, L.J. van Vliet, Improving resolution to reduce aliasing in an undersampled image sequence, in: M.M. Blouke, G.M. Williams, N. Sampat, T. Yeh (eds.), Sensors, Cameras, and Systems, for Scientific/Industrial Applications II (Proc. Electronic Imaging 2000 Conf. San Jose, CA, Jan.24-25), Proc. SPIE, vol. 3965A-23, 2000, p. S4.
  37. D. de Ridder, R.P.W. Duin, P.W. Verbeek, L.J. van Vliet, The use of neural networks in non-linear image processing, Pattern Analysis and Applications, vol. 2, no. 2, 1999, 111-128.
  38. L.J. van Vliet, F.R. Boddeke, D. Sudar, I.T. Young, Image Detectors for Digital Image Microscopy, in: M.H.F. Wilkinson, F. Schut (eds.), Digital Image Analysis of Microbes; Imaging, Morphometry, Fluorometry and Motility Techniques and Applications, Modern Microbiological Methods, John Wiley & Sons, Chichester (UK), 1998, 37-64.
  39. P.J. Verveer, Q.S. Hanley, P.W. Verbeek, L.J. van Vliet, T.M. Jovin, Theory of confocal fluorescence imaging in the programmable array microscope (PAM), Journal of Microscopy, vol. 189, no. 3, 1998, 192- 198.
  40. L.J. van Vliet, I.T. Young, and P.W. Verbeek, Recursive Gaussian Derivative Filters, in: A.K. Jain, S. Venkatesh, B.C. Lovell (eds.), ICPR'98, Proc. 14th Int. Conference on Pattern Recognition (Brisbane, Aug. 16-20), IEEE Computer Society Press, Los Alamitos, 1998, 509-514.
  41. G.M.P. van Kempen, L.J. van Vliet, P.J. Verveer, and H.T.M. van der Voort, A quantitative comparison of image restoration methods for confocal microscopy, Journal of Microscopy - Oxford, vol. 185, no. 3, 1997, 354-365.
  42. F.R. Boddeke, L.J. van Vliet, and I.T. Young, Calibration of the automated z-axis of a microscope using focus functions, Journal of Microscopy - Oxford, vol. 186, no. 3, 1997, 270-274.
  43. H. Netten, I.T. Young, L.J. van Vliet, H.J. Tanke, H. Vrolijk, and W.C.R. Sloos, FISH and chips: Automation of fluorescent dot counting in interphase cell nuclei, Cytometry, vol. 28, no. 1, 1997, 1-10.
  44. E.B. van Munster, L.J. van Vliet , and J.A. Aten, Reconstruction of optical pathlength distributions from images obtained by a wide-field differential interference contrast microscope., Journal of Microscopy - Oxford, vol. 188, no. 2, 1997, November, 149-157.
  45. M. van Ginkel, P.W. Verbeek, and L.J. van Vliet, Improved Orientation Selectivity for Orientation Estimation, in: M. Frydrych, J. Parkkinen, A. Visa (eds.), SCIA'97, Proc. 10th Scandinavian Conference on Image Analysis (Lappeenranta, Finland, June 9-11), 1997, 533-537.
  46. I.T. Young and L.J. van Vliet, Recursive implementation of the Gaussian filter, Signal Processing, vol. 44, no. 2, 1995, 139-151.
  47. S. du Manoir, O.P. Kallioniemi, P. Lichter, J. Piper, P.A. Benedetti, A.D. Carothers, J.A. Fantes, J.M. Garcia-Sagredo, T. Gerdes, M. Giollant, B. Hemery, J. Isola, J. Maahr, H. Morrison, P. Perry, M. Stark, D. Sudar, L.J. van Vliet, N. Verwoerd, and J. Vrolijk, Hardware and software requirements for quantitative analysis of comparative genomic hybridization, Cytometry, vol. 19, no. 1, 1995, 4-9.
  48. P.W. Verbeek and L.J. van Vliet, On the location error of curved edges in low-pass filtered 2-D and 3-D images, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 16, no. 7, 1994, 726-733.
  49. L.J. van Vliet and P.W. Verbeek, Edge localization by MoG filters: Multiple-of-Gaussians, Pattern Recognition Letters, vol. 15, no. 5, 1994, 485-496.
  50. J.C. Mullikin, L.J. van Vliet, H. Netten, F.R. Boddeke, G.W. van der Feltz, and I.T. Young, Methods for CCD camera characterization, in: H.C. Titus, A. Waks (eds.), Image Acquisition and Scientific Imaging Systems, Proc. SPIE, vol. 2173, 1994, 73-84.
  51. L.J. van Vliet and P.W. Verbeek, Better geometric measurements based on photometric information, Proc. IEEE Instrumentation and Measurement Technology Conf. IMTC94 (Hamamatsu, Japan, May 10-12), 1994, 1357-1360.
  52. F.R. Boddeke, L.J. van Vliet, H. Netten, and I.T. Young, Autofocusing in microscopy based on the OTF and sampling, BioImaging, vol. 2, no. 4, 1994, 193-203.
  53. H. Netten, L.J. van Vliet, F.R. Boddeke, P. de Jong, and I.T. Young, A fast scanner for fluorescence microscopy using a 2-D CCD and time delayed integration, BioImaging, vol. 2, no. 4, 1994, 184-192.
  54. L.J. van Vliet, Grey-Scale Measurements in Multi-Dimensional Digitized Images, Ph.D. thesis Delft University of Technology, Delft University Press, Delft, 1993, 1-259.
  55. P.W. Verbeek and L.J. van Vliet, Estimators of 2D edge length and position, 3D surface area and position in sampled grey-valued images, BioImaging, vol. 1, no. 1, 1993, 47-61.
  56. L.J. van Vliet and P.W. Verbeek, Curvature and bending energy in digitized 2D and 3D images, SCIA'93, Proc. of the 8th Scandinavian Conf. on Image Analysis (TromsK, Norway, May 25-28), NOBIM, Norwegian Society for Image Processing and Pattern Recognition, Tromso, Norway, 1993, 1403- 1410.
  57. I.T. Young, R. Zagers, L.J. van Vliet, J. Mullikin, F.R. Boddeke, and H. Netten, Depth-of-focus in microscopy, SCIA'93, Proc. of the 8th Scandinavian Conf. on Image Analysis (TromsK, Norway, May 25-28), NOBIM, Norwegian Society for Image Processing and Pattern Recognition, Tromso, Norway, 1993, 493-498.
  58. B.J.H. Verwer, L.J. van Vliet, and P.W. Verbeek, Binary and grey-value skeletons: Metrics and algorithms, Int. Journal of Pattern Recognition and Artificial Intelligence, vol. 7, no. 5, 1993, 1287-1308.
  59. P.W. Verbeek and L.J. van Vliet, Line and edge detection by symmetry filters, Proc. 11th IAPR Int. Conf. on Pattern Recognition, Volume III, Conf. C: Image, Speech, and Signal Analysis (ICPR11, The Hague, Aug.30-Sep.3), IEEE Computer Society Press, Los Alamitos, CA, 1992, 749- 753.
  60. L.J. van Vliet, I.T. Young, and B.H. Mayall, The Athena semi-automated karyotyping system, Cytometry, vol. 11, no. 1, 1990, 51-58.
  61. B.H. Mayall, J.D. Tucker, M.L. Christensen, L.J. van Vliet, and I.T. Young, Experience with the Athena semi-automated karyotyping system, Cytometry, vol. 11, no. 1, 1990, 59-72.
  62. L.J. van Vliet, I.T. Young, and A.L.D. Beckers, A nonlinear Laplace operator as edge detector in noisy images, Computer Vision, Graphics, and Image Processing, vol. 45, no. 2, 1989, 167-195.
  63. L.J. van Vliet and B.J.H. Verwer, A contour processing method for fast binary neighbourhood operations, Pattern Recognition Letters, vol. 7, no. 1, 1988, 27-36.
  64. P.W. Verbeek, H.A. Vrooman, and L.J. van Vliet, Low-level image processing by max-min filters, Signal Processing, vol. 15, no. 3, 1988, 249-258.
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